Apparatus for establishing electrical contact with electrical components of varying body sizes and terminal spacings



Nov. 24, 1970 G. o. STEGNER 3,543,158

-APPARATUS FOR ESTABLISHING ELECTRICAL CONTACT WITH ELECTRICALCOMPONENTS OF VARYING BODY SIZES AND TERMINAL SPACINGS Filed July 3,196B 3 Sheets-Sheet l INVENTOR 5.0. ST EGNEF? AT TO R NEY G. O. STEGNERNov. 24, 1970 APPARATUS FOR ESTABLISHING ELECTRICAL CONTACT WITHELECTRICAL COMPONENTS OF VARYING BODY SIZES AND TERMINAL SPACINGS FiledJuly 2. 1968 3 Sheets-Sheet 2 t mun Nov. 24. 1970 o, STEGNER I 3,543,158

APPARATUS FOR ESTABLISHING ELECTRICAL CONTACT WITH ELECTRICAL COMPONENTSOF VARYING BODY SIZES AND TERMINAL SPACINGS Filed July 2, 1968 3Sheets-Sheet 3 United States Patent Oflice 3,543,158 Patented Nov. 24,1970 APPARATUS FOR ESTABLISHING ELECTRICAL CONTACT WITH ELECTRICALCOMPONENTS OF VARYING BODY SIZES AND TERMINAL SPACINGS Gustav 0.Stegner, Essex Center, Vt., assignor to Western Electric Company,Incorporated, New York, N.Y., a corporation of New York Filed July 2,1968, Ser. No. 742,007 Int. Cl. G01r 31/00 US. Cl. 324-158 5 ClaimsABSTRACT OF THE DISCLOSURE Apparatus for testing electrical componentshaving spaced terminals extending from one side thereof, wherein thecomponents are of varying lengths or the terminals are of varyingspacings, includes a support for the component permitting limitedmovement of the component longitudinally, test contacts located adjacentthe terminals, and a resilient mechanism for moving the test contactssimultaneously in opposite directions against sides of the terminals, tocentralize the component on the support relative to the test contactsand to exert uniform pressure on the terminals. If desired, second testcontacts may be electrically connected in parallel with respective onesof the first test contacts and a second resilient mechanism may beprovided for moving the second test contacts simultaneously againstopposite sides of the terminals so that the terminals are firmly grippedbetween the first and second test contacts.

BACKGROUND OF THE INVENTION Field of the invention This inventionrelates to the testing of electrical components, and particularly toelectrical components having spaced terminals extending from one sidethereof. Apparatus in accordance with the invention is particularlysuited for testing of electrical components, such as reed relays used inelectronic communications systems, in which the spacing between theterminals varies depending upon the type or size of the component.

Description of the prior art Heretofore, the terminals of an electricalcomponent to be electrically tested have been electrically connected totest circuitry in a variety of manners. For example, it is commonpractice to insert the terminals directly into suitable sockets orreceptacles wired to the test circuitry. In other apparatus thecomponent may be positioned in a nest at a test station, or in a carrierwhich moves the component into the test station, whereupon test probes,which are spaced apart a fixed distance corresponding to the spacingbetween the terminals, are moved into engagement with the terminals. Theterminals also may be connected to the test circuitry manually by leadsand alligator clips.

In general, the above-described procedures are not satisfactory where asingle test set is to test a number of components of varying sizes andterminal spacings. For example, where sockets or receptacles receive thecomponent and its terminals, a different socket or receptacle must beprovided for each size of component or terminal spacing. Similarly,where the component is psitioned in a nest and test probes spaced afixed distance apart are movable into engagement with the terminals ofthe component, different size nests must be provided for each sizecomponent, and ditferently spaced probes must be provided for eachterminal spacing. The use of test leads and alligator clips, of course,is laborious and time consuming, particularly where a large number ofcomponents are involved.

SUMMARY OF THE INVENTION An object of the invention is to provide a newand improved apparatus for the testing of an electrical component havingspaced terminals projecting from one side thereof.

Another object of the invention is to provide a new and improvedapparatus for testing electrical components of varying sizes and havingprojecting terminals of varying spacings, in which the terminals readilycan be electrically connected to test circuitry.

In accordance with the invention, apparatus for testing an electricalcomponent having spaced terminals projecting from one side thereofincludes means for supporting the component for movement substantiallyparallel to a line extending between the terminals. A pair of testcontacts is mounted adjacent the terminals for movement toward and awayfrom one another and the terminals, and yieldable means are provided formoving the contacts substantially simultaneously in opposite directionsand into engagement with respective ones of the terminals to effectcentralization of the component on the supporting means relative to thecontacts, and so that each of the contacts engages its respectiveterminal with a predetermined uniform pressure sufficient to estab lishelectrical contact between the contact and the terminal.

More specifically, each test contact of the pair of test contacts ismounted on a respective one of a pair 05 pivoted arms which areinterconnected so that they move in unison. Resilient mean-s move thearms and the test contacts thereon so that the contacts become engagedWith their respective terminals, and means are provided for moving thearms and the test contact-s thereon away from the terminals against theaction of the resilient means. A second pair of test contacts areelectrically connected in parallel with respective ones of the firstpair of test contacts and are mounted adjacent the terminals formovement toward and away from one another and the terminals, the firstpair of test contacts being located between the terminals and the secondpair of test contacts being located adjacent outer :sides of theterminals. After the operation of the first resilient means, a secondresilient means moves the second pair of test contacts substantiallysimultaneously into engagement with the outer sides of respective onesof the terminals so that the first and second pairs of test contactsfirmly grip the terminals therebetween.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a front elevational view ofthe apparatus, partially in cross section;

FIG. 2 is a partial plan view of the apparatus;

FIG. 3 is a side elevational view of the apparatus, as viewed in thedirection of the arrows 33 in FIG. 1;

FIG. 4 is a cross-sectional, elevational view of the apparatus, takenalong the lines 4-4 of FIG. 1;

FIG. 5 is an enlarged, partial view of the apparatus illustrating itsoperation in connection with an electrical component having a certainsize and terminal spacing; and

FIGS. 6 and 7 are views similar to FIG. 5, illustrating the operation ofthe apparatus in connection with electrical components having differentsizes and terminal spacings.

DETAILED DESCRIPTION The disclosed apparatus is designed for use withsuitable test circuitry (not shown) for testing electrical components 11of different sizes and terminal spacings for electrical characteristics,such as continuity and shorts. In the illustrated embodiment of theinvention, the electrical components 11 are shown as reed relays of atype used in electronic communications equipment. Each of the reedrelays 11 has rows of terminals 12 projecting from one side thereofadjacent its opposite ends, and for purposes of illustration each row ofterminals is shown as having four terminals therein (FIG. 4). Theterminals 12 are embedded in insulation in a plastic or metallic housing13 and the terminals adjacent each end of the relay are electricallyconnected to respective ones of the terminals adjacent the opposite endof the relay by normally closed, internal contacts (not shown) in a wellknown manner.

FIG. 5, 6 and 7, respectively, illustrate portions of the apparatus inconjunction with reed relays 11A, 11B, and 11C having housings 13A, 13B,and 13C of different lengths and rows of terminals 12A, 12B, and 12C ofdifferend spacings, which the disclosed apparatus is designed to handlewithout any substantial change in the construction or arrangement of theapparatus. In this connection, as is apparent from FIGS. 5. 6 and 7, thelength of the housing 13A of the reed relay 11A and the spacing betweenthe rows of its terminals 12A are greater than the lengths of thehousings 13B and 13C of the reed relays 11B and 11C and the spacingsbetween their rows of terminals 12B and 12C. Similarly, the length ofthe housing 13B of the reed relay 11B and the spacing between its rowsof terminals 12B are greater than the length of the housing 13C of thereed relay 11C and the spacing betwen its rows of terminals 12C.

Referring to FIGS. 1 through 4, it is seen that the apparatus includes ahorizontally disposed, rotatable feed plate 14 for indexing the relays11 into and out of a test station shown in these figures. The feed plate14 is removably secured to the upper end of a vertically extending,rotatable shaft 16 in a suitable manner, and the shaft is connetcedadjacent its lower end to a suitable intermittent drive mechanism (notshown) in a drive housing 17. A plurality of elongated, radiallyextending slots 14a, in which the relays 11 are positioned in a suitablemanner at a station preceding the test station, are provided in the feedplate 14 adjacent its periphery. During the indexing of the relays 11into and out of the test station they ride on a curved track 18 securedto the top of a horizontally disposed platform 19, which is suitablysupported in a manner not shown and which is provided with an aperturethrough which the vertical drive shaft 16 for the feed plate extends.

The apparatus includes two sets of test contacts, one set including apair of rows of inner test contacts 21 and the other set including apair of rows of outer test contacts 22 in opposed relationship torespective ones of the rows of inner test contacts. In the illustratedembodiment of the invention there are four test contacts shown in eachrow of test contacts, and thus the apparatus is capable of handling arelay 11 having up to four terminals adjacent each of its opposite ends.

When one of the relays 11 is indexed by the feed plate 14 into the teststation, the terminals 12 adjacent each end of the relay are moved intopositions between respective ones of the opposed inner and outer testconttacts 21 and 22. In this regard, the test contacts 21 and 22 aremovable into open positions, as shown in solid lines in FIGS. 1, 5, 6,and 7, to permit this movement of the terminals 12 herebetween, and alsoare movable into closed positions, as shown in dashed lines in FIGS. 5,6 and 7, in which they engage respective ones of the terminalstherebettween.

The test contacts 21 and 22 are electrically connected by leads 23 torespective laterally spaced terminals 24 on a terminal strip 26, whicheach of the inner test contacts 21 and its opposed outer test contact 22being connected in parallel to the same terminal 24. The terminals 24are suitably connected to the above-mentioned test circuitry (not shown)by leads 27 so that when the test contacts 4 21 and 22 engage theterminals 12 of the relay 11 the desired electrical tests acn beperformed on the relay.

The terminal strip 26 is mounted on a pair of laterally spaced, C-shapedbrackets 28 by being suitably secured across horizontally projectingupper arms 8a thereof. Outer free ends of the arms 28a are securedtogether by an upper cross member 29. The brackets 28 also includevertically extending bight portions 28b and lower horizontallyprojecting arms 280 which are secured together by a lower cross member31, by means of which the brackets are secured to thte underside of theplatform 19 by suitable screws.

Each row of inner test contacts 21 is mounted on a lower end portion ofa vertically disposed arm 32 having a hub 32a adjacent its upper end, bymeans of which it is journalled on a respective one of two horizontallyextending shafts 33. Similarly, the row of outer test contacts 22 inopposed relationship to this row of inner test contacts 21 is mounted ona lower end portion of a vertically disposed arm 34 journalled adjacentits upper end on the same shaft 33 by means of a hub 34a (FIGS. 2, 3,and 4). As is best shown in FIG. 4, to achieve this arrangement theupper and lower portions of each of the arms 32 and its associated arm34 are offset relative to one another and are interconnected by integralinclined intermediate portions, with the lower portions of the arms andrespective ones of the contacts 21 and 22 thereon thus in opposedrelationship. The opposite ends of each shaft 33 are fixedly mounted inthe upper arms 28a of the C- shaped brackets 28.

The arms 32 and the inner test contacts 21 thereon are movable betweentheir open positions and their closed terminal-engaging positions inunison by an operating mechanism 36. The operating mechanism 36 includesa lug 37 (FIGS. 1 and 2) projecting from the hub 32a of one of the arms32 and between a pair of similar lugs 37 on the hub 32a of the other arm32. The lugs 37 are interconnected so that the arms 32 move in unison,by a pin and slot connection 38 including a pivot pin mounted inapertures in the pair of lugs and extending through a slot in thecentral lug. A projecting lever arm 39 also is secured to the hub 32::of the first-mentioned arm 32 and has a bifurcated outer end portionwhich is pivotally connected to an upper end portion of a verticallyextending actuating rod 41. Adjacent its lower end the actuating rod 41is pivotally connected to a bifurcated end portion of a cam lever 42journalled intermediate its ends on a horizontally extending shaft 43,the shaft 43 being fixedly mounted adjacent its opposite ends in thelower arms 280 of the C-shaped brackets 28. The cam lever 42, adjacentits opposite end, carries a cam follower 44 which is engaged with a cam46 for moving the arms 32 to their open positions, the cam being fixedlymounted on an extension of a horizontal drive shaft 47 (FIGS. 1 and 3)journalled in the drive housing 17. The actuating rod 41 is biasedupward to move the arms 32 and the test contacts 21 into their closedterminal-engaging positions by a vertically disposed coil spring 48connected adjacent its upper end to a projecting pin on one of theC-shaped brackets 28 (best shown in FIG. 3) and connected adjacent itslower end to a laterally projecting member on the actuating rod.

The arms 34 and the outer test contacts 22 thereon are moved betweentheir open positions and their closed terminal-engaging positions inunison by an operating mechanism 51. The operating mechanism 51 includesa pair of coil springs 52 disposed horizontally on opposite sides of thearms 32 and 34, each coil spring being connected adjacent its oppositeends to projecting pins on the arms 34 to bias them toward one anotherand into their closed positions. For the purpose of moving the arms 34away from one another and into their open positions, projecting lugs 53,similar to the lugs 37, are provided on the hubs 34a of the arms 34 andare connected together by a pin and slot connection of the same type asthe pin and slot connection 38 for the lugs 37. An operating lever 54has an inner end thereof fixedly secured to the hub 34a of one of thearms 34 and has a bifurcated outer end portion pivotally connected to anupper end portion of a vertically extending actuating rod 56. A lowerend portion of the actuating rod 56 is pivotally connected to one leg ofa bell crank lever 57 journalled on the shaft 43. The other leg of thebell crank lever 57 is provided with a cam follower 58 which rides on acam 59 secured to the horizontal drive shaft 47.

The horizontal drive shaft 47 drives the abovementioned intermittentdrive mechanism for the drive shaft 16 of the indexible feed plate 14through suitable gearing in the drive housing 17. The drive shaft 47 isdriven in a conventional manner by a motor 61 connected thereto by achain drive 62 as shown in FIGS. 1 and 3.

The cams 46 and 59 are designed so that the cam 46 first permits thecoil spring 48 to move the arms 32 and the inner test contacts 21 fromtheir open positions to their closed terminal-engaging positions asshown in dashed lines in FIGS. 5, 6, and 7, whereby the inner testcontacts engage their respective terminals 12 on the relay 11 which isin the test position, to make electrical contact with the terminals, andto center and straighten the relay in its associated radial slot 14a inthe feed plate 14. The second operating cam 59 then permits the coilsprings 52 to move the arms 34 and the outer test contacts 22 into theirclosed terminal-engaging positions, whereby the terminals 12 of therelay 11 become firmly gripped between the inner and outer test contacts21 and 22 to insure good electrical contact between the test contactsand the terminals.

From the foregoing description, it is seen that the apparatus canaccommodate the reed relays 11 even though their housings 13 are ofdifferent lengths and they have different spacings between their rows ofterminals 12. For example, referring to FIG. 5, in which the reed relay11A represents a components having substantially the maximum terminalspacing which can be accommodated by the apparatus with a test contactspacing as disclosed in the drawing, it is seen that when the relay isindexed into the test station by the feed plate 14 the terminals 12A ofthe relay will be located closely adjacent therows of outer testcontacts 22. While the relay 11A could have a position in its associatedradial slot 14a of the feed plate 14 anywhere along the length of theslot, for purposes of illustration the relay housing 13A is shown inFIG. as having a position (solid lines) to the right of center in theradial slot and in abutment with the outer end of the slot. Thus, as theinner test contacts 21 are moved in unison by the operating mechanism36, from their open solid line positions to their closed dashed linepositions in FIG. 5, the left-hand inner test contacts 21 first willengage the inner sides of their associated terminals 12A to move therelay 11A longitudinally to the left in the slot 14a. Subsequently, theright-hand inner test contacts 21 will come into engagement with theinner sides of their respective terminals 12A to limit this movement ofthe relay, and the relay will assume a position as shown in dashedlines. If the relay 11A were to the left of center in the radial slot14a when the relay was indexed into the test station, these functions ofthe left-hand and righthand inner test contacts 21 would be reversed. Ineither situation, the rows of inner test contacts 21 make electricalcontact with the terminals 12 and cooperate to center the relay 11Alongitudinally in the radial slot 14a and relative to one another. Ifthe radial slot 14a is of a width such that the relay can assume askewed position therein, the inner test contacts 21 also will cooperateto straighten or orient the relay in the slot whereby each of the testcontacts will come into proper engagement with its respective terminal12A. The outer test contacts 22 then are moved in unison by theiroperating mechanism 51 into engagement with the outer sides of theterminals 12A, as shown in dashed lines in FIG. 5, whereby the terminals12A are gripped firmly between the inner and outer test contacts 21 and22 to complete the connection of the relay 11A to the above-mentionedtest circuitry (not shown).

The reed relay 11B in FIG. 6 represents a component having substantiallythe shortest housing length that can be accommodated by the apparatusutilizing a feed plate 14 having radial slots 14a of a length as shownin FIG. 5. Thus, assuming that the relay 11B is abutted against one endof its associated radial slot 14a as it is indexed into the teststation, as shown in solid lines in FIG. 6, one row of its terminals 12Bwill be closely adjacent one of the rows of inner test contacts 21,while the other row of its terminals 12B will be closely adjacent one ofthe rows of outer test contacts 22. Then, as the inner test contacts 21are moved into their terminal-engaging positions, the left-hand innertest contacts and the right-hand inner test contacts engage theterminals 12B in sequence, as described hereinabove with reference toFIG. 5, to center and straighten the relay in the radial slot 14a. Theouter test contacts 22 then are moved into their terminal-engagingpositions whereby the terminals 123 of the relay 11B become firmlygripped between the inner and outer test contacts 21 and 22.

The relay 11C in FIG. 7 represents a component having substantially theminimum terminal spacing which can be accommodated by the disclosedapparatus. With the relay 11C, to insure that its terminals 12C willfall between the inner and outer test contacts 21 and 22 when the relay11C is indexed into the test station, the feed plate 14 is replaced by afeed plate 14 having radial slots 14a of less length than the radialslots 14a of the feed plate 14. In other respects, the apparatus is ofthe same construction and operates in the same manner as described abovewith reference to the relays 11A and 11B in FIGS. 5 and 6.

The apparatus also can accommodate reed relays 11 of different widthsand heights, providing the spacing between the rows of the relayterminals 12 is such that they will fit between the inner and outer testcontacts 21 and 22 when the relays are indexed into the test station, asabove described. However, where the relays 11 are of substantiallydifferent widths and/or heights, to insure that the test contacts 21 and22 will properly engage their respective relay terminals 12, it may benecessary to provide interchangeable feed plates 14 having varying widthradial slots 14a, and to provide interchangeable curved tracks 18 ofdiffering thicknesses.

One of the types of shorts in the reed relays 11 which theabove-mentioned test circuitry is designed to test for, when the housing13 of the relay is metallic in nature, is a short between the terminals12 of the relay and the metallic housing. For this purpose, as the relay11 is indexed into the test station its metallic housing 13 engages anelectrical contact in the form of a roller 63 (FIGS. 1 through 4) on anouter end portion of a horizontally extending lever 64. The lever 64 iselectrically connected by a lead 66 to one of the terminals 24 on theterminal strip 26, and the terminal 24 is connected to theabovementioned test circuitry (not shown) by one of the leads 27. Thelever 64 is pivoted intermediate its ends on a support member 67 securedto the intermediate portion 28b of the adjacent C-shaped bracket 28. Acoil spring 68 is connected between an outer end portion of the lever 64and an upstanding pin 69 on the support member 67 to bias the leveragainst a suitable stop 71 (FIGS. 2 and 3) on the bracket 28 and into ahousing contacting position as shown in solid lines in FIG. 2. As therelay 11 is indexed out of the test station, the coil spring 68' permitsthe lever 64 to be moved to a dashed line position as shown in FIG. 2,whereby the indexing of the relay 11 is permitted to take place.

Parts of a relay sorting mechanism, which form no part of this inventionand which therefore are not shown, are located at subsequent stationsabout the periphery of the feed plate 14. These parts of the sortingmechanism are controlled by the above-mentioned test circuitry (notshown) in a suitable manner so that as the relays 11 are indexed by thefeed plate 14 to the subsequent stations, they are sorted, dependingupon Whether they are acceptable or defective, in a manner well known tothose skilled in the art.

OPERATION In operation, the motor 61 (FIG. 1), through the drive chain62 and the horizontal drive shaft 47, causes rotation of the cams 46 and59 of the test contact operating mechanisms 36 and 51, respectively, anddrives the abovementioned intermittent drive mechanism in the drivehousing 17 to rotate the vertical drive shaft 16 intermittently andthereby index the feed plate 14 secured thereto.

The reed relays 11 are loaded into the radial slots 14a in the inderingfeed plate 14 at a station preceding the test station shown in FIGS. 1through 4, in any suitable manner. As the feed plate 14 is indexed itmoves the relays 11 into and out of the test station in succession, withthe relays riding on top of the curved track 18.

When one of the relays 11 is indexed into the test station, theterminals 12 adjacent each end of the relay are moved into positionsbetween respective ones of the inner and outer test contacts 21 and 22.The cam 46 of the operating mechanism 36 for the inner test contacts 21then permits the coil spring 48 to move the vertical actuating rod 41upward, whereby the operating lever 39 on the hub 32a of the righthandinner test contact carrying arm 32, as viewed in FIG. 1, is movedcounterclockwise in this figure. This movement of the operating lever 39causes the arms 32, which are interconnected by the lugs 37 and the pinand slot connection 38, to move away from one another in unison. Thus,the rows of inner test contacts 21 on the arms 32 are moved from theiropen solid line positions, as shown in FIGS. 1, 5, 6, and 7, to theirclosed terminal-engaging positions, as shown in dashed lines in FIGS. 5,6, and 7. As the rows of test contacts 21 engage and make electricalcontact with the inner sides of their respective terminals 12 on therelay 11, they center the relay longitudinally in its associated radialslot 14a and relative to each other, as illustrated in FIGS. 5, 6 and 7,and also straighten or orient the relay longitudinally in the slot if itis skewed therein, so that each of the test contacts properly engagesits respective terminal.

The cam 59 of the operating mechanism 51 for the outer test contacts 22then permits the vertical actuating rod 56 to be moved downward by theaction of the coil springs 52, whereby the coil springs cause the outertest contact carrying arms 34, which are interconnected by the lugs 53and their associated pin and slot connection, to move toward one anotherin unison. This causes the rows of outer test contacts 22 on the arms 34to come into engagement with the outer sides of their respective relayterminals 12, as shown in dashed lines in FIGS. 5, 6, and 7, whereby theterminals become firmly gripped between the inner and outer testcontacts 21 and 22, so as to insure good electrical contact between thetest contacts and the terminals. With the terminals 12 of the relay 11now electrically connected to the above-mentioned test circuitry (notshown) through the test contacts 21 and 22, the leads 23, the terminals24 on the terminal strip 26, and the leads 27, the desired tests areperformed on the relay.

After the desired tests have been performed on the relay 11 theoperating cams 46 and 59 cause the test contact carrying arms 32 and 34to open so that the tested relay can be indexed out of the test stationand a next relay can be indexed into the test station. Morespecifically, the cam 46, through the lever 42, causes downward movementof the vertical actuating rod 41 against the action of the coil spring48. This causes movement of the oper ating lever 39 clockwise, as viewedin FIG. 1, thus causing movement of the interconnected arms 32 and theinner test contacts 21 thereon toward one another and back to their openpositions. At substantially the same time the operating cam 59, throughthe bell crank lever 57, causes upward movement of the verticalactuating rod 56. This causes movement of the operating lever 54counterclockwise, as viewed in FIG. 1, thus causing the interconnectedarms 34 and the outer test contacts 22 thereon to be moved away from oneanother and back to their open positions.

As each of the relays 11 is indexed into the test station its housing 13engages the electrical contact roller 63. If the housing 13 is metallicin nature, the contact roller 63, through its lead 66, its associatedterminal 24 on the terminal strip 26, and its associated lead 27,connects the housing to the above-mentioned test circuitry for thepurpose of testing for shorts between the housing and the relayterminals 12. As the relay 11 subsequently is indexed out of the teststation, the lever 64 on which the contact roller 63 is carried, ispivoted by the relay housing 13 against the action of the levers biasingspring 68 into the dashed line position shown in FIG. 2, whereby theindexing of the relay is permitted to occur.

After the tested relays 11 leave the test station they are indexed bythe feed plate 14 into the subsequent stations in which theabove-mentioned parts of the sorting mechanism are located. The parts ofthe sorting mechanism, which have been properly conditioned by the testcircuitry, then sort the relays 11, depending upon whether they areacceptable or defective, in a manner well known to those skilled in theart.

It is to be understood that the above-described arrangements are simplyillustrative of the application of the principles of this invention.Numerous other arrangements may be readily devised by those skilled inthe art which will embody the principles of the invention and fallwithin the spirit and scope thereof.

What is claimed is:

1. Apparatus for establishing electrical contact with spaced terminalsof electrical components wherein the electrical components havecomponent bodies of varying dimensions in the direction of a lineextending between the terminals and wherein the terminals project fromone side of the component bodies at varying spacings, which comprises:

surface means for supporting the body of each of the components formovement on said surface means substantially parallel to the lineextending between the terminals of the component;

a pair of spaced test contacts movable toward and away from one anotherbetween open positions and terminal engaging positions along apredetermined path;

indexing means for moving the electrical components to bring theterminals of each component into alignment with the predetermined pathof travel of said test contacts, said indexing means including at leastone slot for receiving the component body of any one of the electricalcomponents, the slot defining limits for the movement of the componentalong the line extending between the terminals of the component so thatwhen the terminals are brought into alignment with the predeterminedpath of travel of said test contacts the terminals are located withinlimits defined by the open positions of said test contacts; and

yieldable means for moving said test contacts substantiallysimultaneously in opposite directions and into engagement withrespective ones of the terminals to effect contralization of thecomponent on said surface means relative to said test contacts, and sothat each of said test contacts engages its respective terminal with apredetermined uniform pressure sufiicient to establish electricalcontact between said test contact and the terminal.

2. Apparatus as recited in claim 1, in which:

said test contacts form parts of respective rows of test contacts whichare movable toward and away from one another and respective spaced rowsof terminals of the electrical component;

said rows of test contacts are moved by said yieldable meanssubstantially simultaneously in opposite directions toward and intoengagement with their respective rows of terminals; and

said rows of test contacts cooperate to orient the component uponengaging the rows of terminals so that each of said test contactsengages a respective terminal with pressure sufficient to establishelectrical contact between said test contact and the terminal.

3. Apparatus as recited in claim 1, which further comprises:

a pair of arms pivotally mounted on parallel axes for movement towardand away from one another and the terminals, each of the contacts ofsaid pair of test contacts being mounted on one of said arms;

means interconnectiing said arms so that said arms move in unison withone another;

resilient means for moving said arms and said test contacts thereon sothat said contacts become engaged with their respective terminals; and

means for moving said arms and said test contacts thereon away from theterminals against the action of said resilient means.

4. Apparatus for establishing electrical contact with spaced terminalsof an electrical component extending from one side of the component,which comprises:

means for supporting the component for movement substantially parallelto a line extending between the terminals;

2. first pair of test contacts mounted between the terminals formovement toward and away from one another and the terminals;

first yieldable means for moving said first pair of test contactssubstantially simultaneously and into engagement with inner sides ofrespective ones of the terminals;

a second pair of test contacts electrically connected in parallel withrespective ones of said first pair of test contacts and mounted adjacentouter opposite sides of respective ones of the terminals for movementtoward and away from one another and the terminals; and

second yieldable means for moving said second pair of test contactssubstantially simultaneously and into engagement with the outer sides ofrespective ones of the terminals, said first and second pairs of testcontacts cooperating to efiect centralization of the component on saidsupporting means relative to said test contacts and to grip theterminals firmly therebetween with a predetermined uniform pressuresufficient to establish electrical contact between said test contactsand the terminals.

5. Apparatus as recited in claim 6, in which:

said first and said second yieldable means operate in sequence,respectively.

References Cited UNITED STATES PATENTS 3,412,333 11/1968 Prick 324158RUDOLPH V. ROLINEC, Primary Examiner E. L. STOLARUN, Assistant ExaminerL-SbG-PT UNITED STATES PATENT OFFICE CERTIFICATE OF CORRECTION PatentNo. 395 1-35 5 Da d NQVQEIDQ]: 2h-

lnventot(s) Q, Q. fijggngr It is certified that error appears in theabove-identified patent and that said Letters Patent are herebycorrected as shown below:

ra olumn 2, line 214., "centralization" should read --osntralization--.Column 3, line 18, "and" should read --snt--. Oolum line 29, "bstwon"should road --betwun--. Column 3, line 37, "oonnotood" should read--oonneoted--. Column 3, line 61, "oonttaots should read --oontaots--.Column 3, line 65, "hersbstwosn" should road --therebotwssn-. Oolumn 3,line 71, "which" should read -with--. Column 11., line 2, "son" shouldread "can". Column 1;, line 11, "thta should read "the". Column 5, line38, "components" should read --oomponsnt--. Column 7, line 17,"indsring" should read "indexing". Column 8, line 69, "centralization"should read --oentralization--. Column 10, line 23, "6" should read --1Signed and sealed this 23rd day of March 1 971 (SEAL) Atteat:

EDWARD M.FIETGI-ER,JR. WILLIAM E. SGHUYLER, JR Attesting OfficerCommissioner of Pata't ts

